Wavelength-dependent Process Stability in Laser Micro Welding of Copper with High Thickness Ratios

Plutz L, Bartels D, Hölbling C, Jaskowiak C, Goth C, Schmidt M (2026)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2026

Journal

Journal of Laser Micro Nanoengineering Japan Laser Processing Society (JLPS)

Publisher: Japan Laser Processing Society

Book Volume: 21

Pages Range: 177-185

Journal Issue: 2

DOI: 10.2961/jlmn.2026.02.2012

Authors with CRIS profile

Leonard Plutz Lehrstuhl für Photonische Technologien (LPT)

Involved external institutions

Vitesco Technologies GmbH DE Germany (DE) Bayerisches Laserzentrum gemeinnützige Forschungsgesellschaft mbH (BLZ) DE Germany (DE)

How to cite

APA:

Plutz, L., Bartels, D., Hölbling, C., Jaskowiak, C., Goth, C., & Schmidt, M. (2026). Wavelength-dependent Process Stability in Laser Micro Welding of Copper with High Thickness Ratios. Journal of Laser Micro Nanoengineering, 21(2), 177-185. https://doi.org/10.2961/jlmn.2026.02.2012

MLA:

Plutz, Leonard, et al. "Wavelength-dependent Process Stability in Laser Micro Welding of Copper with High Thickness Ratios." Journal of Laser Micro Nanoengineering 21.2 (2026): 177-185.

BibTeX: Download