Journal of The Electrochemical Society

Journal Abbreviation: J ELECTROCHEM SOC
ISSN: 0013-4651
eISSN: 1945-7111
Publisher: Electrochemical Society

Publications (100)

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Unpublished / Preprint

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Abstract

Enhanced Electrochemical Performance of Graphite Anodes for Lithium-Ion Batteries by Dry Coating with Hydrophobic Fumed Silica (2012) Lux SF, Placke T, Engelhardt C, Nowak S, Bieker P, Wirth KE, Passerini S, et al. Journal article Electrochemical impregnation of silver nanostructures in titanium dioxide nanotubes (2012) Ng SW, Yam FK, Hassan Z Journal article Germanium on silicon photodetectors with broad spectral range (2010) Oehme M, Kaschel M, Werner J, Kirfel O, Schmid M, Bahouchi B, Kasper E, Schulze J Journal article Detailed Carrier Lifetime Analysis of Iron-Contaminated Boron-doped Silicon by Comparison of Simulation and Measurement (2008) Rommel M, Bauer A, Ryssel H Journal article Self-aligned growth of organometallic layers for nonvolatile memories: Comparison of liquid-phase and vapor-phase deposition (2008) Erlbacher T, Jank M, Ryssel H, Frey L, Engl R, Walter A, Sezi R, Dehm C Journal article Electrochemical surface transfer doping: the mechanism behind the surface conductivity of hydrogen terminated diamond (2004) Ristein J, Ley L Journal article Tip-induced nanostructuring of Au3Cu(001) with an electrochemical scanning tunneling microscope (2003) Maupai S, Dakkouri AS, Stratmann M, Schmuki P Journal article, Original article Aspects of barium contamination in high dielectric dynamic random access memories (2000) Boubekeur H, Höpfner J, Mikolajick T, Dehm C, Frey L, Ryssel H Journal article, Original article Synthesis of SiC by high temperature C+ implantation into SiO2: The role of Si/SiO2 interface (1997) Frey L, Stoemenos J, Schork R, Nejim A, Hemment P Journal article, Original article Measurement of shallow arsenic impurity profiles in semiconductor silicon using time-of-flight secondary ion mass spectrometry and total reflection X-ray fluorescence spectrometry (1997) Schwenke H, Knoth J, Fabry L, Pahlke S, Scholz R, Frey L Journal article, Original article